ISO/IEC JTC 1/SC 42 Artificial Intelligence is a standardization subcommittee of the Joint Technical Committee ISO/IEC JTC 1 of the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC). ISO/IEC JTC 1/SC 42 develops and facilitates the development of international standards, technical reports, and technical specifications within the fields of Artificial Intelligence (AI). The international secretariat of ISO/IEC JTC 1/SC 42 is the American National Standards Institute (ANSI), located in the United States of America. The Chair of SC 42 is Wael William Diab. The first meeting of the committee took place in Beijing, China in April 2018. SC 42 meets face-to-face twice a year in an opening and closing plenary format with its subgroups meeting concurrently during the week. SC 42 organizes bi-annual AI workshops that target all stakeholders interested in AI and the committee's work.

History

At the 32nd ISO/IEC JTC 1 Plenary in Vladivostok, Russia, Resolution 12 established SC 42 as a system integration entity for Artificial Intelligence. The resolution also appointed Mr. Wael William Diab as Chair of the SC and Ms. Heather Benko was appointed as the Committee Manager. The inaugural meeting was held in Beijing, China on April 18th – 20th.

Scope

The scope of ISO/IEC JTC 1/SC 42 is:

  • Standardization in the area of Artificial Intelligence
  • Serve as the focus and proponent for JTC 1's standardization program on Artificial Intelligence
  • Provide guidance to JTC 1, IEC, and ISO committees developing Artificial Intelligence applications

ISO/IEC JTC 1/SC 42 is set up as a Systems Integration Entity.

Members

Membership in SC 42 is open to any national body. A member can be either participating (P) or observing (O). The current list of countries active in SC 42 include:

39 p-members: Australia (SA), Austria (ASI), Azerbaijan (AZSTAND), Belgium (NBN), Canada (SCC), China (SAC), Cyprus (CYS), Democratic Republic of the Congo (OCC), Denmark (DS), Egypt (EOS), Finland (SFS), France (AFNOR), Germany (DIN), India (BIS), Ireland (NSAI), Israel (SII), Italy (UNI), Japan (JISC), Kazakhstan (KAZMEMST), Korea, Republic of (KATS), Luxembourg (ILNAS), Malaysia (DSM), Malta (MCCAA), Netherlands (NEN), Norway (SN), Philippines (BPS), Portugal (IPQ), Russian Federation (GOST R), Rwanda (RSB), Saudi Arabia (SASO), Singapore (SSC), Slovakia (UNMS SR), Spain (UNE), Sweden (SIS), Switzerland (SNV), Turkey (TSE), Uganda (UNBS), United Kingdom (BSI), United States (ANSI), Zimbabwe (SAZ).

25 o-members

Structure

ISO/IEC JTC 1/SC 42 is currently made up of five working groups, each of which carries out specific tasks in standards development within the field of Artificial Intelligence. The working groups, study groups, and advisory group of ISO/IEC JTC 1/SC 42 are:

Working GroupTitleConvenor
WG 1Foundational standardsPaul Cotton (Canada)
WG 2Big DataDavid Boyd (United States)
WG 3TrustworthinessDavid Filip (Ireland)
WG 4Use cases and applicationsFumihiro Maruyama (Japan)
WG 5Computational approaches and characteristics of artificial intelligence systemsNing Sun (China)

The subcommittee also administers a number of Joint Work Groups with other subcommittees:

Working GroupTitleConvenor
JWG 2With ISO/IEC JTC 1/SC 7: Testing of AI-based systemsAdam Leon Smith (UK) and Stuart Reid (UK)
JWG 3With ISO/TC 215 WG: AI enabled health informaticsShushaku Tsumoto (Japan)
JWG 4With IEC/TC 65/SC 65A: Functional safety and AI systemsRiccardo Mariani (Italy)

Collaborations

ISO/IEC JTC 1/SC 42 works in close collaboration with a number of other organizations or subcommittees, both internal and external to ISO and IEC. Organizations internal to ISO or IEC that collaborate with or are in liaison to SC 42 include:

JTC 1 Committees and Groups

ISO Committees

  • ISO/TC 69, Applications of statistical methods
  • ISO/TC 215, Applications of statistical methods
  • ISO/TC 299, Applications of statistical methods
  • ISO/TC 307, Blockchain and distributed ledger technologies
  • ISO/TC 309, Governance of organizations

IEC Committees

  • IEC SyC Smart Cities
  • IEC SyC Active Assisted Living
  • IEC SyC Smart Manufacturing
  • IEC/TC 45A Instrumentation, control and electrical power systems of nuclear facilities
  • IEC/TC 56 Dependability
  • IEC/TC 62 Medical equipment, software, and systems
  • IEC/TC 65 Industrial-process measurement, control and automation
  • IEC/TC 65A System aspects
  • IEC/TC 100 Audio, video and multimedia systems and equipment

Organizations external to ISO or IEC that collaborate with or are in liaison with SC 42 include:

Category A Liaisons

ISO/IEC also collaborates with CEN/CENELEC through the Vienna Agreement, specifically with CEN/CENELEC JTC 21, charged with writing standards to support the EU's Artificial Intelligence Act.

Standards

ISO/IEC JTC 1/SC 42 currently has published a number of standards, as well as various other standards or technical reports under development within the field of artificial intelligence. These include:

ISO/IEC StandardTitleStatus
ISO/IEC 5259-1ISO/IEC 5259-1: Data quality for analytics and machine learning — Part 1: Overview, terminology, and examplesPublished (2024)
ISO/IEC 5259-3ISO/IEC 5259-3: Data quality for analytics and machine learning — Part 3: Data quality management requirements and guidelinesPublished (2024)
ISO/IEC 5259-4ISO/IEC 5259-4: Data quality for analytics and machine learning — Part 4: Data quality process frameworkPublished (2024)
ISO/IEC 8183ISO/IEC 8183: Data life cycle frameworkPublished (2023)
ISO/IEC TS 8200ISO/IEC TS 8200: Controllability of automated AI systemsPublished (2024)
ISO/IEC 17903ISO/IEC 17903: Overview of machine learning computing devicesPublished (2024)
ISO/IEC 20546ISO/IEC 20547-1: Big data -- Overview and vocabularyPublished (2019)
ISO/IEC 20547-1ISO/IEC 20547-1: Big data reference architecture -- Part 1: Framework and application processPublished (2020)
ISO/IEC 20547-2ISO/IEC TR 20547-2:2018 : Big data reference architecture -- Part 2: Use cases and derived requirementsPublished (2018)
ISO/IEC 20547-3ISO/IEC 20547-3: Big data reference architecture -- Part 3: Reference architecturePublished (2020)
ISO/IEC 20547-5ISO/IEC TR 20547-5:2018: Big data reference architecture -- Part 5: Standards roadmapPublished (2018)
ISO/IEC 20546ISO/IEC 20546: Big data -- Overview and vocabularyPublished (2019)
ISO/IEC 22989ISO/IEC 22989: Artificial Intelligence Concepts and TerminologyPublished (2022)
ISO/IEC 23053ISO/IEC 23053: Framework for Artificial Intelligence (AI) Systems Using Machine Learning (ML)Published (2022)
ISO/IEC 23894ISO/IEC 23894: Artificial intelligence - Guidance on risk managementPublished (2023)
ISO/IEC TR 24027ISO/IEC TR 24027: Bias in AI systems and AI aided decision makingPublished (2021)
ISO/IEC TR 24028ISO/IEC TR 24028: Overview of trustworthiness in artificial intelligencePublished (2020)
ISO/IEC TR 24368ISO/IEC TR 24368: Overview of ethical and societal concernsPublished (2022)
ISO/IEC 24668ISO/IEC 24668: Process management framework for big data analyticsPublished (2022)
ISO/IEC TS 4213ISO/IEC TS 4213: Assessment of Machine Learning Classification PerformancePublished (2022)
ISO/IEC 24029-1ISO/IEC TR 24029-1: Assessment of the robustness of neural networks — Part 1: OverviewPublished (2021)
ISO/IEC 24029-2ISO/IEC 24029-2: Assessment of the robustness of neural networks — Part 2: Methodology for the use of formal methodsPublished (2023)
ISO/IEC 24030ISO/IEC 24030: AI use casesPublished (2024)
ISO/IEC TS 25058ISO/IEC TS 25058: Systems and software Quality Requirements and Evaluation (SQuaRE) - Guidance for quality evaluation of AI systemsPublished (2024)
ISO/IEC 25059ISO/IEC 25059: Systems and software Quality Requirements and Evaluation (SQuaRE) - Quality model for AI systemsPublished (2023)
ISO/IEC 42001ISO/IEC 42001: AI management systemPublished (2023)
ISO/IEC 5338ISO/IEC 5338: AI system life cycle processesPublished (2023)
ISO/IEC 5339ISO/IEC 5339: Guidance for AI applicationsPublished (2024)
ISO/IEC 5392ISO/IEC 5392: Reference architecture of knowledge engineeringPublished (2024)
ISO/IEC 5469ISO/IEC 5469: Functional safety and AI systemsPublished (2024)

Awards

In 2023, the ISO/IEC JTC 1/SC 42 has won ISO's Lawrence D. Eicher Award.

See also